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Ding Liping presents at First National Symposium on Atomic-Level Manufacturing Metrology

Time:2026-06-09 Author: Source:Click:

On June 7, 2026, Prof. Ding Liping from the Institute of New Concept Sensors and Molecular Materials at Shaanxi Normal University attended the First National Symposium on Atomic-Level Manufacturing and Metrology held in Xi’an. At the Engineering Workshop session, Ding Liping presented an invited report titled Interface-Confined Film Preparation Techniques and Their Applications in Fluorescence Sensing, in which she introduced the principles behind the preparation of interface-confined polymer-assembled nanomembranes and presented research findings on their applications in detection for CBRN and key physical parameters.

The conference was organized by the Chinese Society of Micro/Nano Technology and its Branch of Atomic-Level Manufacturing and Metrology, and co-hosted by the National Key Laboratory of Precision Micro/Nano Manufacturing Technology and the School of Instrument Science and Technology at Xi’an Jiaotong University,.

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